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Growth and structural properties of silicene at multilayer coverage

Journal of physics. Condensed matter : an Institute of Physics journal | 15 Apr 2014

E Salomon, R El Ajjouri, GL Lay and T Angot
Abstract
At monolayer coverage, silicene on Ag(1 1 1) may present different structural phases depending on the growth conditions. At multilayer coverage, only one structural phase has been reported: the [Formula: see text] phase. However, no link between the structural arrangement of the monolayer and that of the multilayer has been addressed. In this paper, reporting experimental work based on low-energy electron diffraction and scanning tunneling microscopy, we focus on the structural aspects of a multilayer film of silicene. We demonstrate that it exhibits one structural arrangement, namely the [Formula: see text] form, but with different domain orientations resulting from the structural properties of the initial wetting monolayer.
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Concepts
Electron beam lithography, Electron microscope, Low-energy electron diffraction, Scanning probe microscopy, Diffraction, Microscopy, Scanning tunneling microscope, Electron
MeSH headings
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